Skip to main navigation Skip to search Skip to main content

Unveiling Student Trial-and-Error Patterns through a Optimized Deep Learning for Accurate Profiling

  • Faiz Hilmawan Masyfa*
  • , Tibyani Tibyani
  • , Novan Andre Andriansyah Putra
  • , Moh Zulfiqar Naufal Maulana
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Student trial-and-error behavior plays a crucial role in cognitive development, yet traditional profiling methods often fail to capture the underlying patterns accurately. This study introduces a novel approach to uncovering these patterns through a deep learning framework designed for accurate profiling. The framework utilizes a hybrid model combining DBSCAN clustering, Multilayer Perceptron (MLP) classification, and Genetic Algorithm (GA) for training optimization, enhancing model accuracy. One of the key challenges addressed by this framework is the invisible distribution of trial-and-error tendencies in the data, as the class distribution is not readily apparent, small samples, and the dataset suffers from class imbalance. The results demonstrate significant improvements in profiling accuracy compared to traditional methods, with accuracy reaching 86.67%, precision at 89.45%, recall at 86.67%, and F 1-score of 85.78%. This research provides a comprehensive solution for predictive cognitive characteristic, laying the foundation for personalized learning strategies and improved educational outcomes.

Original languageEnglish
Title of host publication2025 9th International Conference on Electrical, Electronics and Information Engineering, ICEEIE 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350393064
DOIs
Publication statusPublished - 2025
Event9th International Conference on Electrical, Electronics and Information Engineering, ICEEIE 2025 - Mataram, Indonesia
Duration: 2 Sept 2025 → 3 Sept 2025

Publication series

Name2025 9th International Conference on Electrical, Electronics and Information Engineering, ICEEIE 2025

Conference

Conference9th International Conference on Electrical, Electronics and Information Engineering, ICEEIE 2025
Country/TerritoryIndonesia
CityMataram
Period2/09/25 → 3/09/25

Keywords

  • cognitive profiling
  • DBSCAN
  • genetic algorithm
  • multilayer perceptron
  • student trial-and-error

Fingerprint

Dive into the research topics of 'Unveiling Student Trial-and-Error Patterns through a Optimized Deep Learning for Accurate Profiling'. Together they form a unique fingerprint.

Cite this