TY - GEN
T1 - Mask Optimization with Auxiliary Lines for Image Inpainting
AU - Du, Weiwei
AU - Yuto, Urano
AU - Sari, Irawati Nurmala
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Image inpainting is widely used in image reconstruction, image matting, 3D generation from 2D images [1], and many other tasks. Existing inpainting methods can be broadly classified into two categories: deep learning-based approaches [3] and non-deep learning-based approaches. Deep learning models require high-performance computing resources, and some patch-based inpainting methods [2] do not restore damaged regions well due to interference between the line structure region and the texture region.This paper proposes a patch-based image inpainting method based on mask optimization with auxiliary lines. The proposed method separates the line structure region from the texture region with mask optimization, thereby preventing mutual interference and maintaining consistency between the repaired and undamaged regions. In addition, damaged regions with strong gradients can be effectively restored. The effectiveness of the proposed method has been verified using the evaluation metrics PSNR, SSIM, and MSSSIM.
AB - Image inpainting is widely used in image reconstruction, image matting, 3D generation from 2D images [1], and many other tasks. Existing inpainting methods can be broadly classified into two categories: deep learning-based approaches [3] and non-deep learning-based approaches. Deep learning models require high-performance computing resources, and some patch-based inpainting methods [2] do not restore damaged regions well due to interference between the line structure region and the texture region.This paper proposes a patch-based image inpainting method based on mask optimization with auxiliary lines. The proposed method separates the line structure region from the texture region with mask optimization, thereby preventing mutual interference and maintaining consistency between the repaired and undamaged regions. In addition, damaged regions with strong gradients can be effectively restored. The effectiveness of the proposed method has been verified using the evaluation metrics PSNR, SSIM, and MSSSIM.
KW - Auxiliary lines
KW - Image inpainting
KW - Mask optimization
UR - https://www.scopus.com/pages/publications/105033350578
U2 - 10.1109/ICSAI68704.2025.11345855
DO - 10.1109/ICSAI68704.2025.11345855
M3 - Conference contribution
AN - SCOPUS:105033350578
T3 - Proceedings - 2025 11th International Conference on Systems and Informatics, ICSAI 2025
BT - Proceedings - 2025 11th International Conference on Systems and Informatics, ICSAI 2025
A2 - Li, Qingli
A2 - Wang, Yan
A2 - Wang, Lipo
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International Conference on Systems and Informatics, ICSAI 2025
Y2 - 13 December 2025 through 15 December 2025
ER -