Abstract
There are three types of materials, which are widely used for modern solar panels - monocrystalline, polycrystalline, and amorphous. In this article, we have constructed the one diode model of these three different materials in order to find their I-V characteristic curves under partial shading conditions (PSCs). We have demonstrated that a maximum power point (MPP) tracker, under the same PSCs spends less time and has better tracking efficiency in tracking the MPP of a solar panel, made of amorphous silicon, because this type of solar panel has the lowest curvature value compared to the monocrystalline and the polycrystalline silicon panels. Various state-of-the-art maximum power point tracking algorithms are used to validate this finding. Experimental validation for both static and dynamic PSCs are conducted in the article.
| Original language | English |
|---|---|
| Article number | 9219187 |
| Pages (from-to) | 17-25 |
| Number of pages | 9 |
| Journal | IEEE Transactions on Industry Applications |
| Volume | 57 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2021 |
| Externally published | Yes |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- Curvature
- ideality factor
- maximum power point tracking (MPPT)
- one diode models (ODM)
- partial shading condition (PSC)
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