Influence of the waveform and DC offset on the asymmetric hysteresis loop in Au/PZT/Pt/Al2O3/SiO2/Si thin films prepared by MOCVD method

doi:10.4028/www.scientific.net/AMM.467.155

Influence of the waveform and DC offset on the asymmetric hysteresis loop in Au/PZT/Pt/Al₂O₃/SiO₂/Si thin films prepared by MOCVD method

Masruroh^*

^*Corresponding author for this work

Faculty of Mathematics and Natural Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, the hysteresis loop of Au/PZT/Pt/Al₂O₃/SiO₂/Si thin films was experimentally measured in different conditions as a waveform and a DC offset, using a precision LC Radiant technology RT-66. The measurements were taken by applying a drive to the Pt bottom electrode connected to the drive of the precision LC and the Au top electrode was connected to the drive of the precision LC. The waveform was applied as wave type = sine; peak voltage = 6 V; frequency = 1 KHz and duration = 100 s. The results show that, by applying waveform and DC offset the hysteresis loop softly changes the polarization (Pr) and coercive field (Vc).

Original language	English
Title of host publication	Materials Science and Mechanical Engineering
Pages	155-159
Number of pages	5
DOIs	https://doi.org/10.4028/www.scientific.net/AMM.467.155
Publication status	Published - 2014
Event	2013 International Conference on Materials Science and Mechanical Engineering, ICMSME 2013 - Kuala Lumpur, Malaysia Duration: 27 Oct 2013 → 28 Oct 2013

Publication series

Name	Applied Mechanics and Materials
Volume	467
ISSN (Print)	1660-9336
ISSN (Electronic)	1662-7482

Conference

Conference	2013 International Conference on Materials Science and Mechanical Engineering, ICMSME 2013
Country/Territory	Malaysia
City	Kuala Lumpur
Period	27/10/13 → 28/10/13

Keywords

DC offset
Polarization and coercive field
PZT films
Waveform

Access to Document

10.4028/www.scientific.net/AMM.467.155

Cite this

@inproceedings{3088b82169494bd39f0ee3c25c20f790,

title = "Influence of the waveform and DC offset on the asymmetric hysteresis loop in Au/PZT/Pt/Al2O3/SiO2/Si thin films prepared by MOCVD method",

abstract = "In this paper, the hysteresis loop of Au/PZT/Pt/Al2O3/SiO2/Si thin films was experimentally measured in different conditions as a waveform and a DC offset, using a precision LC Radiant technology RT-66. The measurements were taken by applying a drive to the Pt bottom electrode connected to the drive of the precision LC and the Au top electrode was connected to the drive of the precision LC. The waveform was applied as wave type = sine; peak voltage = 6 V; frequency = 1 KHz and duration = 100 s. The results show that, by applying waveform and DC offset the hysteresis loop softly changes the polarization (Pr) and coercive field (Vc).",

keywords = "DC offset, Polarization and coercive field, PZT films, Waveform",

author = "Masruroh",

year = "2014",

doi = "10.4028/www.scientific.net/AMM.467.155",

language = "English",

isbn = "9783037859490",

series = "Applied Mechanics and Materials",

pages = "155--159",

booktitle = "Materials Science and Mechanical Engineering",

note = "2013 International Conference on Materials Science and Mechanical Engineering, ICMSME 2013 ; Conference date: 27-10-2013 Through 28-10-2013",

}

Masruroh 2014, Influence of the waveform and DC offset on the asymmetric hysteresis loop in Au/PZT/Pt/Al₂O₃/SiO₂/Si thin films prepared by MOCVD method. in Materials Science and Mechanical Engineering. Applied Mechanics and Materials, vol. 467, pp. 155-159, 2013 International Conference on Materials Science and Mechanical Engineering, ICMSME 2013, Kuala Lumpur, Malaysia, 27/10/13. https://doi.org/10.4028/www.scientific.net/AMM.467.155

TY - GEN

T1 - Influence of the waveform and DC offset on the asymmetric hysteresis loop in Au/PZT/Pt/Al2O3/SiO2/Si thin films prepared by MOCVD method

AU - Masruroh,

PY - 2014

Y1 - 2014

N2 - In this paper, the hysteresis loop of Au/PZT/Pt/Al2O3/SiO2/Si thin films was experimentally measured in different conditions as a waveform and a DC offset, using a precision LC Radiant technology RT-66. The measurements were taken by applying a drive to the Pt bottom electrode connected to the drive of the precision LC and the Au top electrode was connected to the drive of the precision LC. The waveform was applied as wave type = sine; peak voltage = 6 V; frequency = 1 KHz and duration = 100 s. The results show that, by applying waveform and DC offset the hysteresis loop softly changes the polarization (Pr) and coercive field (Vc).

AB - In this paper, the hysteresis loop of Au/PZT/Pt/Al2O3/SiO2/Si thin films was experimentally measured in different conditions as a waveform and a DC offset, using a precision LC Radiant technology RT-66. The measurements were taken by applying a drive to the Pt bottom electrode connected to the drive of the precision LC and the Au top electrode was connected to the drive of the precision LC. The waveform was applied as wave type = sine; peak voltage = 6 V; frequency = 1 KHz and duration = 100 s. The results show that, by applying waveform and DC offset the hysteresis loop softly changes the polarization (Pr) and coercive field (Vc).

KW - DC offset

KW - Polarization and coercive field

KW - PZT films

KW - Waveform

UR - https://www.scopus.com/pages/publications/84891079148

U2 - 10.4028/www.scientific.net/AMM.467.155

DO - 10.4028/www.scientific.net/AMM.467.155

M3 - Conference contribution

AN - SCOPUS:84891079148

SN - 9783037859490

T3 - Applied Mechanics and Materials

SP - 155

EP - 159

BT - Materials Science and Mechanical Engineering

T2 - 2013 International Conference on Materials Science and Mechanical Engineering, ICMSME 2013

Y2 - 27 October 2013 through 28 October 2013

ER -